Ultra high resolution Atomic Force Microscope (AFM)

• Physical Sciences

Contact for external services

Protocol / GCS

• Protocol for CIC nanoGUNE nanoscience external services (self-service / service mode – equipment usage).
• General Conditions for Services (IP-nanoGUNE).
• General Conditions for Services (IP-shared).
• General Conditions for Services (IP-client).

A mechano-optical atomic force microscope (AFM) capable of detecting forces in the nano- and piconewton range. It scans surfaces using a pyramidal or conical tip attached to a flexible microcantilever (0.1–0.5 mm). The system enables continuous recording of three-dimensional (3D) surface topography and local mechanical properties at the nanometer scale across various operating modes.

The new infrastructure will be integrated into CIC nanoGUNE’s Advanced Microscopy Platform (NGN-010), keeping the laboratory at the forefront of nanoscience and accessible to internal, external, and industrial users.

Equipment

• Mechano-optical atomic force microscope (AFM) with force detection in the nanonewton-to-piconewton (nN–pN) range
• Pyramidal/conical tips attached to flexible microcantilevers
• Operating modes for 3D topography imaging and mapping of local mechanical properties
• Control and data acquisition systems for continuous nanoscale measurements

• 3D topographic imaging with nanometer-scale resolution
• Mapping of local mechanical properties (elasticity, adhesion, etc.)
• Measurements on material and biomaterial samples, including polymers, coatings, and nanostructures
• Sample preparation and conditioning, with support for data interpretation
• Integration of results with other advanced microscopy techniques

CIC nanoGUNE

Tolosa Hiribidea, 76, E-20018 Donostia / San Sebastián

Healthcare Technologies:

- Biological and Preclinical Testing

- Biomedical Engineering

Application sectors

• Electronics and microtechnology