Ikerketa arloak
- Physical Sciences
Kontaktua
Kanpoko erabiltzaileentzako eskuragarri?
Yes
Sarbide protokoloa
Deskribapena
A platform dedicated to the electrical characterization and transport properties of materials and nanodevices, combining precision instrumentation with measurement stations and cryostats. It enables the acquisition of current–voltage (I–V) curves, conduction parameters, Hall effect measurements, and AC response (impedance/capacitance) under varying thermal and environmental conditions. These capabilities are essential for validating sensors, semiconductors, and electronic devices.
Equipment
- Electrical measurement stations with cryostats
- Precision electronics (Keithley, Agilent) for I–V sourcing and measurement
- Hall effect measurement system
- Impedance analyzer
- Semiconductor device analyzer
- Test chambers with thermal and environmental control
- Electrical data acquisition and analysis software
Zerbitzuak
- I–V curves and contact characterization
- Resistance, conductance, and Hall effect measurements
- Estimation of carrier mobility and carrier density
- Impedance spectroscopy and AC parameter measurements as a function of temperature
- Characterization of sensors and nanoelectronic devices
- Technical support and design of measurement protocols
Kokapena
CIC nanoGUNE
Tolosa Hiribidea, 76, E-20018 Donostia / San Sebastián
10/5000
Beste informazio batzuk
Characterization and Inspection:
- Electronics and Embedded Systems
- Digital Technologies
Application sectors
- Capital equipment
- Capital equipment / Metalworking industry
- Electronics and microtechnology
Industry plan
- IRABAZI · Advanced Manufacturing
