Ikerketa arloak
- Physical Sciences
Kontaktua
Kanpoko erabiltzaileentzako eskuragarri?
Yes
Sarbide protokoloa
Deskribapena
An advanced microscopy platform integrating imaging and spectroscopy techniques to characterize materials, surfaces, and nanodevices, from the nanometer scale down to atomic resolution. It combines scanning probe microscopy (AFM/STM), near-field optical microscopy (SNOM), and electron microscopy (TEM/ESEM) to investigate morphology, structure, interfaces, and functionality across a wide range of materials.
Equipment
- Multimode atomic force microscope (AFM)
- Scanning tunneling microscope (STM) with environmental control
- Near-field scanning optical microscopy (SNOM) system with infrared (IR) spectroscopy
- JEOL transmission electron microscope (TEM)
- FEI Quanta 650 environmental scanning electron microscope (ESEM)
- Anti-vibration platforms and isolation chambers
- Image acquisition and analysis systems
Zerbitzuak
- Nanoscale topographical, structural, and functional characterization
- Studies of surfaces, interfaces, coatings, and nanoparticles
- Imaging and analysis of nanodevices and soft and hard materials
- Correlative measurements using complementary techniques available on the platform
- User training and advanced technical support
- Microscopy services for collaborative R&D and industrial projects
Kokapena
CIC nanoGUNE
Tolosa Hiribidea, 76, E-20018 Donostia / San Sebastián
10/5000
Beste informazio batzuk
Biological and Preclinical Testing:
- Biomedical Engineering
- Healthcare Technologies
Application sectors
- Electronics and microtechnology
- Construction materials
- Healthcare and medical devices
Industry plan
- HAZI · Healthcare and Biosciences
