X-ray diffraction laboratory for residual stress analysis

• Engineering & Technology

Tel:+34 943 206 744

TEKNIKER laboratory equipped with an X-ray diffractometer for the crystallographic and stress characterisation of solid and powdered materials.

The laboratory enables the measurement of residual stresses — a critical parameter affecting fatigue life and component integrity — as well as the identification and quantification of crystalline phases, determination of atomic structures and analysis of crystallite size.

Its capabilities support the optimisation of manufacturing processes, heat treatments, surface treatments and advanced coatings.

Equipment

• X-ray diffractometer (XRD) for measurements on solid and powdered materials
• Diffractogram analysis software for phase identification, phase quantification and residual stress determination
• Certified calibration standards

• Residual stress measurement by X-ray diffraction in components and materials
• Identification and quantification of crystalline phases
• Determination of atomic structures and crystallite size
• Characterisation of coatings and surface layers
• Support for the optimisation of manufacturing processes, heat treatments and surface treatments
• Analysis of powdered materials
• Correlation between residual stress states and in-service performance

TEKNIKER
Technology Park, Iñaki Goenaga, 5, 20600, Eibar (Gipuzkoa)

Characterisation and Inspection:

- Metrology and Inspection Technologies

- Advanced Manufacturing Technologies

Application sectors

• Aeronautics and aerospace
• Automotive industry
• Capital goods and industrial equipment
• Machine tools and robotics

Industry programmes

• HAZI · Aerospace
• IRABAZI · Automotive Components
• IRABAZI · Advanced Manufacturing