- Physical Sciences
Surface Analysis Platform at the CIC energiGUNE is a laboratory equipped with the state-of-the-art techniques to deal with surfaces and thin films of different materials. We can handle materials in solid state, including powders and polymers and in some cases even liquids. Surface composition, electronic and geometric structure can be probed by combination of several complimentary spectroscopic and microscopic techniques: X-ray photoelectron spectroscopy (XPS), Auger electron spectroscopy (AES), Scanning Auger microscopy/Scanning electron microscopy (SAM/SEM), Raman spectroscopy, Near-field scanning optical microscopy (NSOM), Tip enhanced Raman spectroscopy (TERS), Scanning tunneling microscopy/Atomic force microscopy on air and in liquid. The services are provided for research groups within the center as well as to the external users like other research centers or other public organization, but also to commercial companies and private people.
Photoelectron spectroscopy for chemical analysis on surfaces (SPECS) Electron analyzer (FOIBOS 150 2D-DLD) X-ray sources: Mg-and Al- non-monochromated and Al- and Ag- monochromated (FOCUS) UV source Ion-sources for sputtering and depth profiling Li deposition chamber Depositing material: Li. Could be modified to evaporate other kinds of alkali metals Base pressure < 5E-9 mbar. Pressure during deposition ~10e-7 mbar Sample size: standard 10mm x 10mm, but can be accommodated up to ~25mm x 25 mm in case of need. Up to 3 samples can be loaded in one load Substrates for deposition: any vacuum compatible material. Samples can be transferred in and out without exposing to air in the air tight container. The container fits to the standard glove box. Surface structure and microscopy LEED and SEM/SAM High Pressure Cell integrated into the XPS spectrometer: sample heating up to 800oC under gas pressure up to 20 bar Electrochemical cell (3 electrodes setup) integrated into the XPS spectrometer and coupled with Raman spectrometer for in-situ Raman characterization. Surface preparation and thin film deposition Electron beam evaporators Effusion cell evaporator Lithium thermal deposition source Sample heating up to 1000oC and cooling down to 100K Tool for air-free sample transferring between XPS spectrometer and glove box and/or other UHV chamber AFM/STM Microscope (Agilent) Tip scanning STM/AFM Environmental control, measurements in dedicated glove box Measurements in liquids Electrochemistry Temperature measurements STM Electric and magnetic measurements: KFM, EFM, MFM Scan ranges in X and Y: 100 x 100 Âµm2 and 10 x 10 Âµm2 Sample temperature control: heating up to 250 oC Raman integrated system (Ranishaw) Raman spectroscopy with 532nm and 785 nm lasers Motorized sample stage provides depth profiling in X-, Y-, Z- directions Raman spectroscopy in vacuum with remote laser probe (532nm) FTIR spectrometer Vertex 70 (Bruker) Platinum ATR setup, spectral range: 8000 cm-1 - 10 cm-1 FTIR Microscope HYPERION 2000 Room temperature Detector DLaTGS for spectral range from 6000 cm-1 to 130 cm-1 LN2 cooled MCT detectors Sample compartment with environmental control Magnetron Sputtering System (Pfeiffer) DC and AC magnetrons - Versatility to evaporate materials of diverse nature (conductive metals, insulating ceramic type ...), including materials with high melting point. Deposition at the different temperatures of the substrate (up to 600oC). Control of deposition rate with quarts microbalance. Available gases: oxygen, nitrogen, argon Stylus Profiler (Bruker) This equipment is necessary to accurately determine the thickness and roughness of the thin films and surfaces of the different materials on the length scale between 100 nm and 100 micron.
CIC energiGUNE Parque Tecnológico de Álava 01510 Miñano Tel. +34.945.297108