Electron Microscope- FEI- TECNAI G2 F20 S-TWIN

Model: 
FEI - TECNAI G2 F20 S-TWIN
Purchase year: 
2016
Features: 

The FEI Tecnai G2 is a 200kV field emission gun (FEG) high resolution TEM/STEM, which was installed at CIC Energigune in 2010, enabling you to solve a wide variety of materials science challenges in an easy and fast way. This electron microscopy excels in versatility and flexibility by combining high performance in all TEM, EFTEM, Lorentz, STEM and EDX/EELS spectrum imaging modes. The key feature of this microscope is the low energy spread of the electron beam (0.7 eV@200kV or less) which combined with the SuperTwin objective lens with a Cs of 1.2 mm, allows the determination of the electronic properties at atomic resolution.